Musashino, Japan

Tomohiro Kajikawa

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Yokogawa Electric Corporation. Active years: 2021.


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Tomohiro Kajikawa: Innovator in Failure Detection Technology

Introduction

Tomohiro Kajikawa is a notable inventor based in Musashino, Japan. He has made significant contributions to the field of failure detection technology. His innovative work has led to the development of a patent that addresses critical aspects of detecting physical quantities.

Latest Patents

Kajikawa holds a patent for a "Failure detection apparatus, failure detection method, and non-transitory computer readable recording medium." This invention includes a RAM and a controller designed to execute processing related to the detection of a physical quantity within a predetermined sampling period. The RAM features partitioned areas created by dividing the entire area of the RAM. The controller is programmed to perform sequential failure detection on a portion of these partitioned areas during times when it is not executing processing in each sampling period.

Career Highlights

Tomohiro Kajikawa is associated with Yokogawa Electric Corporation, a company known for its advancements in industrial automation and control. His work at this organization has allowed him to focus on innovative solutions that enhance operational efficiency and reliability.

Collaborations

Kajikawa has collaborated with notable colleagues, including Shouji Igarashi and Hidekazu Tanaka. Their combined expertise has contributed to the development of cutting-edge technologies in their field.

Conclusion

Tomohiro Kajikawa is a distinguished inventor whose work in failure detection technology has made a significant impact. His innovative patent and contributions to Yokogawa Electric Corporation highlight his commitment to advancing technology in this critical area.

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