The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2021

Filed:

Apr. 16, 2019
Applicant:

Yokogawa Electric Corporation, Musashino, JP;

Inventors:

Shouji Igarashi, Musashino, JP;

Hidekazu Tanaka, Musashino, JP;

Tomohiro Kajikawa, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 3/06 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0712 (2013.01); G06F 3/0619 (2013.01); G06F 3/0644 (2013.01); G06F 3/0679 (2013.01); G06F 11/301 (2013.01);
Abstract

A failure detection apparatus () includes a RAM () and a controller () configured to execute processing related to detection of a physical quantity in a predetermined sampling period (T). The RAM () includes partitioned areas generated by partitioning the entire area of the RAM (). The controller () is configured to execute sequential failure detection on a portion of the partitioned areas during a time when the controller () is not executing the processing in each of the sampling periods (T).


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