This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Bridgestone Corporation. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Innovations by Tomohiko Fujii in Tire Inspection Technology
Introduction
Tomohiko Fujii is a notable inventor based in Kodaira, Japan. He has made significant contributions to the field of tire inspection technology. His innovative approach focuses on improving the accuracy of tire contour measurements, which is crucial for ensuring safety and performance in the automotive industry.
Latest Patents
Fujii holds a patent for a "Tire contour measurement data correction method and tire visual inspection device." This invention addresses the challenges posed by tire deflection during visual inspections. The method involves obtaining a sidewall image of the tire at various rotation angles and correcting the contour deformation caused by deflection. By utilizing advanced image processing techniques, the method enhances the reliability of tire inspections.
Career Highlights
Tomohiko Fujii is associated with Bridgestone Corporation, a leading company in the tire manufacturing industry. His work at Bridgestone has allowed him to focus on innovative solutions that enhance tire safety and performance. With a patent portfolio that includes 1 patent, Fujii has established himself as a key figure in tire technology.
Collaborations
Fujii has collaborated with Akinobu Mizutani, contributing to the development of advanced tire inspection methods. Their partnership has led to significant advancements in the accuracy and efficiency of tire inspections.
Conclusion
Tomohiko Fujii's contributions to tire inspection technology exemplify the importance of innovation in ensuring automotive safety. His patented methods represent a significant step forward in the field, showcasing the potential for further advancements in tire technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
