The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Aug. 04, 2011
Tomohiko Fujii, Kodaira, JP;
Akinobu Mizutani, Kodaira, JP;
Tomohiko Fujii, Kodaira, JP;
Akinobu Mizutani, Kodaira, JP;
BRIDGESTONE CORPORATION, Tokyo, JP;
Abstract
In order to conduct a visual inspection correctly for a tire having deflection, contour deformation caused by the deflection of the tire is corrected with respect to tire contour measurement data. A tire contour measurement data correction method includes a step of obtaining a sidewall image in a tire radial direction at each certain rotation angle by a sensor portion while rotating a tire T to be inspected by a tire rotation portion, a step of dividing the sidewall image by a predetermined ratio by an image processing portion and approximating the sidewall image of each divided section by a straight line, a step of calculating an inclination angle in a horizontal direction of the approximate straight line, and a step of rotating the sidewall image of each divided section so that the inclination angle of the approximate straight line agrees with a predetermined angle determined for each divided section.