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For the Inventor, By the Inventor

Fujisawa, Japan

Tomikazu Tanuki

This inventor holds 13 USPTO granted patents and 5 published patent applications, plus 11 CIPO patents, primarily in Mining Vehicle Technology. Top assignees: Komatsu Corporation, Sumco Techxiv Kabushiki Kaisha. Active years: 1999-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomikazu Tanuki. Retrieved from https://idiyas.com/inventor/tomikazu-tanuki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 13 

% Patents Active = 92.3

 

Average Co-Inventor Count = 4.9

ph-index = 5

Forward Citations = 157(Granted Patents)


Location History:

  • Hiratsuka, JP (1999)
  • Fujisawa, JP (2008 - 2020)

Company Filing History:

goldMedal12 out of 2,828 
 
Komatsu Corporation
 patents
silverMedal1 out of 6 
 
Sumco Techxiv Kabushiki Kaisha
 patents

Years Active: 1999-2020

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Areas of Expertise:
Mining Machine
Perimeter Monitoring
Work Vehicle
Obstacle Detection
Dump Truck
Wafer Inspection
Semiconductor Packages
Load Display
13 patents (USPTO):Explore Patents
1. 10800406 - Mining machine, management system of mining machine, and management method of mining machine (2020-10-13),
2. 10321097 - Perimeter monitoring device for work vehicle (2019-06-11),
3. 9956915 - Dump truck periphery monitoring apparatus (2018-05-01),
4. 9597997 - Work vehicle periphery monitoring apparatus (2017-03-21),
5. 9497422 - Perimeter monitoring device for work vehicle (2016-11-15),
6. 9457719 - Work vehicle periphery monitoring system and work vehicle (2016-10-04),
7. 9442194 - Dump truck with obstacle detection mechanism and method for detecting obstacle (2016-09-13),
8. 9294736 - Working vehicle periphery monitoring system and working vehicle (2016-03-22),
9. 9291709 - Dump truck (2016-03-22),
10. 9204106 - Load display device for dump truck (2015-12-01),
11. 8982212 - Surrounding area monitoring device for work vehicle (2015-03-17),
12. 7383156 - Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface (2008-06-03),
13. 6005965 - Inspection apparatus for semiconductor packages (1999-12-21),

Title: Tomikazu Tanuki: Innovator in Mining Technology

Introduction

Tomikazu Tanuki is a prominent inventor based in Fujisawa, Japan. He has made significant contributions to the field of mining technology, holding a total of 13 patents. His innovative designs focus on enhancing the efficiency and safety of mining operations.

Latest Patents

Tanuki's latest patents include a range of advanced technologies for mining machines. One notable invention is a mining machine that features a traveling device capable of navigating a path within a mine. This machine is equipped with a non-contact sensor that detects objects in its vicinity, ensuring safe operation. Additionally, he has developed a perimeter monitoring device for work vehicles, which utilizes multiple cameras and sensors to monitor the surroundings and provide real-time feedback to operators.

Career Highlights

Throughout his career, Tomikazu Tanuki has worked with leading companies in the industry, including Komatsu Corporation and Sumco Techxiv Kabushiki Kaisha. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in mining technology.

Collaborations

Tanuki has collaborated with notable colleagues such as Takeshi Kurihara and Dai Tsubone. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion

Tomikazu Tanuki's work in mining technology exemplifies the spirit of innovation. His patents and collaborations continue to influence the industry, paving the way for safer and more efficient mining practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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