Company Filing History:
Years Active: 2022-2025
Title: Innovations by Tomas Onderlicka
Introduction
Tomas Onderlicka is an inventor based in Brno, Czech Republic. He is known for his contributions to the field of microscopy imaging and sample preparation techniques. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.
Latest Patent Applications
1. **AUTOMATIC GRID FINGER DETECTION** - This application relates to sample support imaging and sample location identification at a sample support for microscopy imaging. The system comprises a memory that stores and a processor that executes computer-executable components. These components include a beam directing component that instructs a focused ion beam (FIB) device to direct an ion beam at a sample support, and a field application component that affects secondary charged particles emitted from the sample support due to the ion beam. This is achieved by directing activation of a negative field from the beam system during the application of the ion beam by the FIB device.
2. **METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS** - This application provides a method for preparing a sample for TEM analysis. The method involves cleaning the sample to remove a redeposition layer, imaging the cleaned sample to identify a location of a region of interest, and removing material from the sample based on the identified location. The sample thinning step is performed based on the detected location of the region of interest, which involves removing uneven surfaces and thinning the remaining bulk substrate to achieve a defined thickness.
Conclusion
Tomas Onderlicka's innovative approaches in microscopy imaging and sample preparation highlight his potential as an inventor in the field. His latest patent applications demonstrate his commitment to advancing technology in this area.