Company Filing History:
Years Active: 2008-2009
Title: Innovations by Tom Walker in Photoluminescence Technology
Introduction
Tom Walker is an accomplished inventor based in Portland, OR (US). He has made significant contributions to the field of photoluminescence technology, holding 2 patents that focus on identifying defects in material layers of various samples. His work has implications for improving the quality and reliability of semiconductor manufacturing processes.
Latest Patents
Walker’s latest patents include innovative methods for photoluminescence imaging. The first patent describes a method and apparatus that utilizes photoluminescence to identify defects in specified material layers of a wafer or other workpiece. This method employs filtering elements to isolate predetermined wavelengths of return light emitted from the sample, ensuring that only the relevant signals are detected. The second patent outlines a technique for non-contact measurement of contaminants and defects located below the surface of a sample. This method involves performing multiple probes with lasers of different wavelengths to generate data sets that help identify defects in both surface and sub-surface regions.
Career Highlights
Tom Walker has built a successful career at Nanometrics Inc., where he has been instrumental in advancing photoluminescence technologies. His innovative approaches have not only enhanced the understanding of material defects but have also contributed to the development of more efficient manufacturing processes in the semiconductor industry.
Collaborations
Throughout his career, Walker has collaborated with notable colleagues, including Steven G. Hummel and Nicolas Laurent. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Tom Walker's contributions to photoluminescence technology exemplify the impact of innovative thinking in the field of semiconductor manufacturing. His patents reflect a commitment to enhancing the quality and efficiency of material analysis, paving the way for future advancements in the industry.