Kasugai, Japan

Tohru Yasuda


Average Co-Inventor Count = 4.8

ph-index = 3

Forward Citations = 35(Granted Patents)


Company Filing History:


Years Active: 1996-2014

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4 patents (USPTO):Explore Patents

Title: Tohru Yasuda: Innovator in Semiconductor Technology

Introduction

Tohru Yasuda is a prominent inventor based in Kasugai, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 4 patents. His work focuses on enhancing the performance and reliability of semiconductor devices.

Latest Patents

Yasuda's latest patents include innovative designs and methods that address critical challenges in semiconductor operations. One of his notable patents is for a semiconductor device and operation monitoring method. This invention features a monitor that includes a first element connected between two power supply lines, along with a load that increases the load value. A determination unit assesses the operating state of the first element based on the monitor's output. Another significant patent is for a multi-bus semiconductor device and its testing method. This invention allows for efficient DC testing of individual pads while managing multiple devices simultaneously, ensuring accurate measurements and improved testing processes.

Career Highlights

Throughout his career, Tohru Yasuda has worked with esteemed companies such as Fujitsu Corporation and Fujitsu VLSI Limited. His experience in these organizations has allowed him to develop and refine his expertise in semiconductor technology, contributing to advancements in the industry.

Collaborations

Yasuda has collaborated with notable colleagues, including Seiji Yamamoto and Hirosuke Koumyoji. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Tohru Yasuda's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor devices and testing methods.

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