The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2008
Filed:
Mar. 15, 2005
Seiji Yamamoto, Kasugai, JP;
Hirosuke Koumyoji, Kasugai, JP;
Tohru Yasuda, Kasugai, JP;
Mikio Ishikawa, Kasugai, JP;
Isaya Sobue, Kasugai, JP;
Hajime Sato, Kasugai, JP;
Chiaki Furukawa, Kasugai, JP;
Akira Sugiura, Kasugai, JP;
Akihiro Iwase, Kasugai, JP;
Seiji Yamamoto, Kasugai, JP;
Hirosuke Koumyoji, Kasugai, JP;
Tohru Yasuda, Kasugai, JP;
Mikio Ishikawa, Kasugai, JP;
Isaya Sobue, Kasugai, JP;
Hajime Sato, Kasugai, JP;
Chiaki Furukawa, Kasugai, JP;
Akira Sugiura, Kasugai, JP;
Akihiro Iwase, Kasugai, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A multi-bus semiconductor device and a method of its probing test perform the DC test for individual pads of a device while dealing with an adequate number of devices for simultaneous measurement based on the scheme of input/output pad number compressive test. The semiconductor device includes switch elements SW-SWconnected between input/output pads P-Pand a testing line Lso that pads in an arbitrary combination, among the off-probe pads P-Pthat are not made in contact with the tester probe Pr, are selected for testing in correspondence to the combination of switch elements that are turned on. The input/output buffers of the pads under test are deactivated to block their internal current paths. The corresponding switch elements are turned on to connect the off-probe pads under test to the probe pad Pthat is made in contact with the tester probe Pr, and the leak current of the probes is measured with the tester TS.