This inventor holds 1 USPTO granted patent. Top assignee: Southwest Research Institute. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Todd S. Mintz: Innovator in Pipeline Integrity Monitoring
Introduction
Todd S. Mintz is a notable inventor based in San Antonio, TX (US). He has made significant contributions to the field of pipeline integrity monitoring through his innovative patent. His work focuses on enhancing the safety and reliability of buried pipelines, which are critical for various industries.
Latest Patents
Todd S. Mintz holds a patent for a system titled "Local electrochemical impedance spectroscopy (LEIS) for detecting coating defects in buried pipelines." This invention involves a method for acquiring and analyzing LEIS data from buried structures, such as pipelines. The system utilizes a special probe with adjustable electrodes placed in the soil above the structure. By applying a voltage to the pipeline, the system detects current variations that indicate coating defects. The probe electrodes then acquire a response signal, which is analyzed to identify any defects present.
Career Highlights
Todd S. Mintz is associated with the Southwest Research Institute, where he applies his expertise in electrochemical impedance spectroscopy. His work is pivotal in developing technologies that ensure the integrity of critical infrastructure. With a focus on innovation, he continues to contribute to advancements in pipeline monitoring.
Collaborations
Some of his notable coworkers include Biswajit Dasgupta and Pavan Kumar Shukla. Their collaborative efforts enhance the research and development initiatives at the Southwest Research Institute.
Conclusion
Todd S. Mintz is a distinguished inventor whose work in pipeline integrity monitoring has the potential to significantly impact the safety of buried infrastructure. His innovative approach to detecting coating defects is a testament to his commitment to advancing technology in this essential field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
