The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Aug. 10, 2010
Applicants:

Pavan K. Shukla, San Antonio, TX (US);

Todd S. Mintz, San Antonio, TX (US);

Biswajit Dasgupta, Helotes, TX (US);

Jay L. Fisher, Alamo Heights, TX (US);

Osvaldo Pensado-rodriguez, San Antonio, TX (US);

Inventors:

Pavan K. Shukla, San Antonio, TX (US);

Todd S. Mintz, San Antonio, TX (US);

Biswajit Dasgupta, Helotes, TX (US);

Jay L. Fisher, Alamo Heights, TX (US);

Osvaldo Pensado-Rodriguez, San Antonio, TX (US);

Assignee:

Southwest Research Institute, San Antonio, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and associated methods for acquiring and analyzing LEIS data from a buried structure, such as a pipeline. A special probe having adjustable electrodes is placed in the soil above the structure. A voltage is applied to the structure, causing more current to emanate from a coating defect than from intact coating. The probe electrodes acquire a response signal, which is analyzed to detect the defect.


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