This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2018.
Company Filing History:
Years Active: 2018
Title: The Innovations of Todd L Cohen
Introduction
Todd L Cohen is an accomplished inventor based in Wappingers Falls, NY (US). He has made significant contributions to the field of microelectronic chip testing and diagnostics. His innovative approach has led to the development of a unique patent that enhances the efficiency of chip testing processes.
Latest Patents
Todd L Cohen holds a patent for a "Bitwise rotating scan section for microelectronic chip testing and diagnostics." This invention describes a computer-implemented method for testing a microelectronic chip. The method involves dividing the chip into multiple sections, each containing at least two latch sets in at least one scan chain. The processor determines whether each section fails a data test by interleaving the sections and scanning alternating latch sets from each scan chain.
Career Highlights
Todd is currently employed at International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in technology and microelectronics.
Collaborations
Throughout his career, Todd has collaborated with talented individuals such as Mary Prilotski Kusko and Hari Krishnan Rajeev. These collaborations have fostered a creative environment that encourages the exchange of ideas and innovation.
Conclusion
Todd L Cohen's contributions to microelectronic chip testing demonstrate his commitment to innovation and excellence in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving testing methodologies.