The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Jun. 21, 2016
International Business Machines Corporation, Armonk, NY (US);
Todd L. Cohen, Wappingers Falls, NY (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Hari K. Rajeev, Kerala, IN;
Timothy C. Taylor, Austin, TX (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
According to an embodiment of the present invention, a computer-implemented method for testing a microelectronic chip is described. The method may include dividing, via a processor running a scanning engine, a plurality of sections of the microelectronic chip. Each of the plurality of sections includes at least two latch sets in at least one scan chain. The method may further include determining, via the processor, based on the dividing, whether each of the plurality of sections fail a data test. The determining comprises interleaving the plurality of sections by scanning, via the processor, an alternating latch set from each scan chain in a first section, and scanning an alternating latch set from each scan chain in a second section.