Company Filing History:
Years Active: 2014-2018
Title: Innovations by Timothy C. Taylor
Introduction
Timothy C. Taylor is a notable inventor based in Austin, TX, who has made significant contributions to the field of microelectronics. With a total of 2 patents, his work focuses on enhancing the testing and calibration processes of microelectronic chips.
Latest Patents
One of his latest patents is titled "Bitwise rotating scan section for microelectronic chip testing and diagnostics." This invention describes a computer-implemented method for testing a microelectronic chip by dividing it into multiple sections and determining if any sections fail a data test. The method involves interleaving sections by scanning alternating latch sets from each scan chain. Another significant patent is for the "Calibration of an on-die thermal sensor." This method includes setting a wafer to a control temperature, applying power to a thermal sensor circuit, calibrating the sensor, and storing the calibration result for future use.
Career Highlights
Timothy C. Taylor is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of microelectronics. His work has contributed to advancements in chip testing and diagnostics, making processes more efficient and reliable.
Collaborations
Throughout his career, Timothy has collaborated with notable colleagues such as James M. Crafts and Joseph E. Dery, further enhancing the impact of his inventions.
Conclusion
Timothy C. Taylor's contributions to microelectronics through his patents and collaborations highlight his role as a significant inventor in the industry. His innovative methods for chip testing and calibration continue to influence the field positively.