This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Texas Instruments Corporation. Active years: 2000-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000-2004
Title: Innovations by Todd D Stubblefield
Introduction
Todd D Stubblefield is a notable inventor based in Sherman, TX (US). He has made significant contributions to the field of integrated circuit testing, holding 2 patents that showcase his innovative approach to improving testing methodologies.
Latest Patents
His latest patents include the "Multiprobe blob test in lieu of 100% probe test" and the "In-situ multiprobe retest method with recovery recognition." These inventions focus on a test methodology that immediately retests failed chips to recover false tester reads without losing test floor capacity during multiprobe production testing of integrated circuit chips on a wafer. This method allows for a second retest of a chip prior to the multiprobe moving to the next chip on the wafer, thus eliminating lost time in repositioning the multiprobe.
Career Highlights
Todd D Stubblefield is currently employed at Texas Instruments Corporation, where he continues to develop and refine testing technologies. His work has had a significant impact on the efficiency of integrated circuit testing processes.
Collaborations
He has collaborated with notable coworkers such as Craig Reagan and Eugene Tudor Gharis, contributing to a dynamic and innovative work environment.
Conclusion
Todd D Stubblefield's contributions to the field of integrated circuit testing through his patents and work at Texas Instruments Corporation highlight his role as a key innovator in the industry. His inventions are paving the way for more efficient testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile