The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2000
Filed:
Jan. 15, 1998
Applicant:
Inventors:
Todd Stubblefield, Sherman, TX (US);
Craig Reagan, Sherman, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; G01R / ; B07C / ;
U.S. Cl.
CPC ...
438 10 ; 438 17 ; 324754 ; 209573 ;
Abstract
This invention is a test methodology that immediately retests failed chips to recover false tester reads with no loss of test floor capacity during multiprobe production testing of integrated circuit chips on a wafer. This method retests a chip a second time prior to the multiprobe going to the next chip on the wafer, thus eliminating lost time in repositioning the multiprobe.