This inventor holds 3 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 1999-2003.
Company Filing History:
Years Active: 1999-2003
Title: Todd C Nielsen: Innovator in Endpoint Detection Technology
Introduction
Todd C Nielsen is a notable inventor based in Meridian, ID (US). He has made significant contributions to the field of technology, particularly in the area of endpoint detection. With a total of 3 patents to his name, Nielsen's work has had a considerable impact on various applications.
Latest Patents
One of Todd C Nielsen's latest patents is a method and apparatus employing an external light source for endpoint detection. This innovative technology is designed for the stripping of specific materials, such as photo-resist material, from a substrate surface. The process involves projecting a beam of light onto the substrate surface, where the fluoresced and/or reflected light intensity at a particular wavelength band is measured by a light detector. The light intensity is then converted to a numerical value and transmitted electronically to a control mechanism. This mechanism determines the proper disposition of the substrate and controls the cessation of the stripping process. Additionally, it may manage a substrate-handling device that sequentially transfers substrates to and from a stripping chamber.
Career Highlights
Todd C Nielsen is currently employed at Micron Technology Incorporated, where he continues to develop and refine his innovative technologies. His work at Micron has allowed him to collaborate with other talented professionals in the field.
Collaborations
Some of his notable coworkers include David R Johnson and Robert J Hatfield. Their combined expertise contributes to the advancement of technology within the company.
Conclusion
In summary, Todd C Nielsen is a distinguished inventor whose work in endpoint detection technology has led to significant advancements in the field. His contributions continue to influence the industry and inspire future innovations.