Franklin Park, NJ, United States of America

Tirtha Pandya

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Bank of America Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tirtha Pandya. Retrieved from https://idiyas.com/inventor/tirtha-pandya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Tirtha Pandya and His Patent on System Simulation and Abnormality Detection.

Introduction

Tirtha Pandya is an inventor associated with Franklin Park, New Jersey, and Bank of America Corporation. His patent work addresses the use of simulated scenarios to detect abnormalities in software applications and, where possible, resolve them automatically.

Latest Patents

Pandya is listed as an inventor on 1 patent: “System Simulation and Abnormality Detection.” The invention describes a computing platform that identifies applications for analysis, runs simulated scenarios for each application, and records abnormality results. It can compare deployed application versions with the captured results to identify abnormalities, assess whether they can be resolved automatically, and execute commands to modify an affected application when appropriate.

Career Highlights

Pandya’s listed patent connects his inventive work with Bank of America Corporation. It focuses on applying simulation and automated analysis to help identify and address abnormalities in deployed applications.

Collaborations

Pandya’s listed coworkers include Silpa Mokkapati and Yogi Ahuja. The patent’s described approach brings together application information, simulated scenarios, abnormality results, and automated corrective actions.

Conclusion

Tirtha Pandya’s patent highlights an approach to software reliability that combines scenario-based simulation, abnormality detection, and potential automated remediation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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