The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2026
Filed:
Jan. 03, 2024
Bank of America Corporation, Charlotte, NC (US);
Silpa Mokkapati, Lawrenceville, NJ (US);
Yogi Ahuja, Warwick, PA (US);
Subhashish Panda, Plainsboro, NJ (US);
Tirtha Pandya, Franklin Park, NJ (US);
Jeonghoon Lee, East Brunswick, NJ (US);
Roman Zhitnitskiy, Langhorne, PA (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
Arrangements for simulation generation and abnormality detection are provided. In some examples, a computing platform may identify a plurality of applications for analysis. The computing platform may execute a plurality of simulated scenarios for each application and, based on execution of the simulated scenarios, the computing platform may capture abnormality results for each application. The abnormality results, as well as application information and/or simulated scenarios may be stored. In some examples, the computing platform may compare deployed versions of each application to the captured abnormality data to identify an abnormality in a deployed version of an application. Based on the identified abnormality, the computing platform may evaluate the identified abnormality to determine whether it can be resolved automatically. If so, the computing platform may execute one or more commands modifying the deployed application to resolve the abnormality.