Ting Xue

Title: Ting Xue: Innovator in Thermographic Image Processing

Introduction

Ting Xue is a notable inventor based in Chengdu, China. He has made significant contributions to the field of thermographic image processing, particularly in the separation of defect images from thermogram sequences. With a total of 4 patents, his work has advanced the accuracy and efficiency of defect detection methods.

Latest Patents

Ting Xue's latest patents include innovative methods for separating defect images from thermogram sequences. One of his notable inventions is a method based on a weighted naive Bayesian classifier and dynamic multi-objective optimization. This invention focuses on extracting physical quantities from different types of thermal response times (TTRs) and classifying them into categories, enhancing the rationality of TTR classification and improving defect image separation accuracy. Another significant patent involves a method based on feature extraction and multi-objective optimization, which clusters TTRs based on their physical features, ensuring a more representative selection of representative TTRs for accurate defect outline description.

Career Highlights

Ting Xue has worked with prominent organizations, including Chengdu Di'ao Pharmaceutical Group Co., Ltd. and the University of Electronic Science and Technology of China. His experience in these institutions has contributed to his expertise in thermographic image processing and optimization techniques.

Collaborations

Some of Ting Xue's notable coworkers include Jianxin Ji and Na Guo, who have collaborated with him on various projects related to his patents and research.

Conclusion

Ting Xue's innovative work in thermographic image processing has led to advancements in defect detection methods, showcasing his expertise and contributions to the field. His patents reflect a commitment to improving accuracy and efficiency in image processing technologies.