Hsinchu, Taiwan

Ting-Shuan Yeh

This inventor holds 1 USPTO granted patent. Top assignee: National Applied Research Laboratories. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ting-Shuan Yeh. Retrieved from https://idiyas.com/inventor/ting-shuan-yeh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations of Ting-Shuan Yeh

Introduction

Ting-Shuan Yeh is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of image recognition technology. His innovative approach focuses on size estimation methods that utilize specific targets and given scales.

Latest Patents

One of his key patents is titled "Method for size estimation by image recognition of specific target using given scale." This invention relates to a method for estimating the size of a specific target by recognizing a reference object in an image and establishing a corresponding scale. The process involves searching for the specific target and estimating its size based on the acquired scale. This patent showcases his expertise in combining image recognition with practical applications.

Career Highlights

Ting-Shuan Yeh is affiliated with the National Applied Research Laboratories, where he continues to develop and refine his innovative ideas. His work has garnered attention for its potential applications in various industries, particularly in enhancing image processing techniques.

Collaborations

He collaborates with talented individuals such as Meng-Wei Lin and Jo-Yu Chang, contributing to a dynamic research environment that fosters innovation and creativity.

Conclusion

Ting-Shuan Yeh's contributions to image recognition technology exemplify the impact of innovative thinking in solving real-world problems. His work continues to inspire advancements in the field, paving the way for future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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