The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Jun. 22, 2020
Applicant:
National Applied Research Laboratories, Taipei, TW;
Inventors:
Jyh-Horng Wu, Hsinchu, TW;
Chien-Hao Tseng, Hsinchu, TW;
Meng-Wei Lin, Hsinchu, TW;
Ting-Shuan Yeh, Hsinchu, TW;
Yi-Hao Hsiao, Hsinchu, TW;
Shi-Wei Lo, Hsinchu, TW;
Fang-Pang Lin, Hsinchu, TW;
Hsin-Hung Lin, Hsinchu, TW;
Jo-Yu Chang, Hsinchu, TW;
Assignee:
National Applied Research Laboratories, Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/62 (2017.01); G06V 10/40 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G06T 7/62 (2017.01); G06T 5/007 (2013.01); G06V 10/40 (2022.01); G06V 20/56 (2022.01);
Abstract
The present invention relates to a method for size estimation by image recognition of a specific target using a given scale. First, a reference objected is recognized in an image and the corresponding scale is established. Then the specific target is searched and the size of the specific target is estimated according to the acquired scale.