Hsinchu, Taiwan

Meng-Wei Lin

This inventor holds 1 USPTO granted patent. Top assignee: National Applied Research Laboratories. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Meng-Wei Lin. Retrieved from https://idiyas.com/inventor/meng-wei-lin-ialpzbzf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Meng-Wei Lin: Innovator in Image Recognition Technology

Introduction

Meng-Wei Lin is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of image recognition technology. His innovative approach focuses on size estimation of specific targets using a given scale.

Latest Patents

Meng-Wei Lin holds a patent for a method titled "Method for size estimation by image recognition of specific target using given scale." This invention relates to a technique for estimating the size of a specific target by recognizing a reference object in an image and establishing a corresponding scale. The method allows for accurate size estimation based on the acquired scale.

Career Highlights

Meng-Wei Lin is currently employed at the National Applied Research Laboratories. His work there emphasizes the application of advanced image recognition techniques in various fields. His dedication to research and innovation has positioned him as a key figure in his area of expertise.

Collaborations

Some of his notable coworkers include Yi-Hao Hsiao and Jyh-Horng Wu. Their collaborative efforts contribute to the advancement of technology in image recognition.

Conclusion

Meng-Wei Lin's contributions to image recognition technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to inspire future developments in this important area of research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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