Hsinchu, Taiwan

Jo-Yu Chang

This inventor holds 1 USPTO granted patent. Top assignee: National Applied Research Laboratories. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jo-Yu Chang. Retrieved from https://idiyas.com/inventor/jo-yu-chang-pop75api

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Jo-Yu Chang: Innovator in Image Recognition Technology

Introduction

Jo-Yu Chang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of image recognition technology. His innovative approach focuses on size estimation methods that utilize specific targets and given scales.

Latest Patents

Jo-Yu Chang holds a patent titled "Method for size estimation by image recognition of specific target using given scale." This invention relates to a method that allows for accurate size estimation by recognizing a reference object in an image and establishing a corresponding scale. The specific target is then searched, and its size is estimated based on the acquired scale. This patent showcases his expertise in merging technology with practical applications.

Career Highlights

Chang is currently employed at the National Applied Research Laboratories, where he continues to develop and refine his innovative ideas. His work has positioned him as a key figure in advancing image recognition technologies.

Collaborations

Some of his notable coworkers include Jyh-Horng Wu and Chien-Hao Tseng. Their collaborative efforts contribute to the ongoing research and development in their field.

Conclusion

Jo-Yu Chang's contributions to image recognition technology through his patent and work at the National Applied Research Laboratories highlight his role as an influential inventor. His innovative methods pave the way for advancements in size estimation techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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