Shanghai, China

Ting He

This inventor holds 2 USPTO granted patents. Top assignees: Chinese Academy of Sciences, Omnion Power Technology Gmbh. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ting He. Retrieved from https://idiyas.com/inventor/ting-he-8izmv7kp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Innovations of Ting He in Infrared Photodetector Technology.

Introduction

Ting He is an accomplished inventor based in Shanghai, China. She has made significant contributions to the field of infrared photodetectors, showcasing her expertise through her innovative patent.

Latest Patents

Ting He holds a patent for a "Momentum-matching and band-alignment van der Waals (vdW) infrared photodetector and fabrication method thereof." This invention provides a novel approach to infrared photodetection, incorporating a substrate, a dielectric layer, a BiOSe layer, a black phosphorus (BP) layer, and metal source and drain components. The fabrication method involves a meticulous process of transferring layers and fabricating metal components, resulting in a vertical structure that enhances performance.

Career Highlights

Ting He is affiliated with the Chinese Academy of Sciences, where she continues to push the boundaries of research and innovation. Her work has garnered attention for its potential applications in various technological fields.

Collaborations

Ting has collaborated with notable colleagues, including Weida Hu and Zhen Wang, who contribute to her research endeavors and enhance the collaborative spirit of innovation.

Conclusion

Ting He's contributions to infrared photodetector technology exemplify her innovative spirit and dedication to advancing scientific knowledge. Her patent reflects a significant step forward in the field, promising to impact future developments in photodetection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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