Woodinville, WA, United States of America

Timothy G Fleehart


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2004-2008

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2 patents (USPTO):Explore Patents

Title: Innovations by Timothy G Fleehart

Introduction

Timothy G Fleehart is an accomplished inventor based in Woodinville, WA (US). He has made significant contributions to the field of software analysis, holding 2 patents that focus on improving defect detection in complex software systems. His work is instrumental in enhancing the reliability and efficiency of software programs.

Latest Patents

Timothy's latest patents include a system and method for whole-system program analysis. This innovative approach facilitates defect detection in software systems composed of multiple computer programs. By utilizing information about cross-program interactions and dependency relationships, his method allows for a comprehensive analysis of individual programs. This ensures that the behavior of the entire system is accurately represented. The process involves reading a list of dependency relationships to determine the order of program analysis. Subsequently, the programs are analyzed in that order, with insights from earlier analyses informing the evaluation of later programs.

Career Highlights

Timothy G Fleehart is currently associated with Microsoft Technology Licensing, LLC, where he continues to develop and refine his innovative ideas. His expertise in software systems has positioned him as a valuable asset in the tech industry.

Collaborations

Timothy has collaborated with notable colleagues, including Jonathan D Pincus and Jeffrey S Wallace. Their combined efforts contribute to the advancement of technology and software analysis.

Conclusion

Timothy G Fleehart's contributions to software analysis through his patents reflect his dedication to innovation in the tech industry. His work not only enhances software reliability but also sets a foundation for future advancements in the field.

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