The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2004
Filed:
Dec. 13, 2000
Timothy G. Fleehart, Woodinville, WA (US);
Jonathan D. Pincus, Bellevue, WA (US);
Jeffrey S. Wallace, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Defect detection in a software system made of multiple computer program programs is facilitated by using information about cross-program interactions and dependency relationships between programs to analyze the individual programs in such a way that the behavior of the system as a whole is accurately represented. A list of dependency relationships is read in; these dependency relationships are used to determine an order in which the programs should be analyzed. The programs are then analyzed in that order. Information from the analysis of the programs is used to inform the analysis of subsequently-analyzed programs.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile