Tien-Chung Lee

Title: The Innovative Mind of Tien-Chung Lee

Introduction

Tien-Chung Lee, an esteemed inventor hailing from Zhubei, Taiwan, has made significant contributions to the field of semiconductor technology. With a remarkable portfolio of two patents, he stands out as a key figure in the development of innovative solutions for probe card alignment in semiconductor device testing.

Latest Patents

Among his latest patents is a groundbreaking method and system for aligning probe cards in semiconductor device testing. This method entails providing a probe card equipped with a plurality of probe needles, whose distal ends are aligned on a reference plane. Notably, the process involves illuminating the reference plane from both the upper and lower sides, which enhances accuracy. A camera captures images of the probe needles, and the alignment process is performed based on the generated images, ensuring precise testing in semiconductor applications.

Career Highlights

Tien-Chung Lee is currently associated with Taiwan Semiconductor Manufacturing Company Limited, where he continues to push the boundaries of innovation. His work has laid important groundwork that contributes to the efficiency and effectiveness of semiconductor testing processes.

Collaborations

Throughout his career, Lee has collaborated with talented colleagues, including Kai-Di Chuang and Chiu-Hua Chung. These collaborations have led to the sharing of knowledge and expertise, facilitating advancements in semiconductor testing technologies.

Conclusion

In conclusion, Tien-Chung Lee's innovative approach to semiconductor testing and his effective alignment techniques have significantly impacted the industry. With his notable patents and collaborative spirit, he exemplifies the dedication and creativity that drives innovation in technology.