Tien-Chun Wei

Title: Tien-Chun Wei: Innovator in Fault-Test Pair Ranking

Introduction

Tien-Chun Wei is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of testing and evaluation systems, particularly in the area of fault detection. His innovative approach has led to the development of a unique method that enhances the efficiency of testing programs.

Latest Patents

Tien-Chun Wei holds a patent titled "Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system." This patent involves a sophisticated process for ranking fault-test pairs using two sets of waveform statistics. The first set includes value-change information regarding logic variations for each bit of reference outputs from a test run. The second set captures similar information for faulty outputs resulting from the design code injected with faults. By determining relative differences between these two sets of statistics, Wei's method allows for a more accurate ranking of fault-test pairs based on waveform differences.

Career Highlights

Tien-Chun Wei is currently employed at Synopsys, Inc., a leading company in electronic design automation. His work at Synopsys has positioned him as a key player in the development of advanced testing methodologies. With a focus on innovation, Wei continues to push the boundaries of what is possible in the realm of fault detection and testing.

Collaborations

Throughout his career, Tien-Chun Wei has collaborated with esteemed colleagues such as Jean-Marc Albert Forey and Kai Yang. These partnerships have fostered an environment of creativity and innovation, leading to advancements in their respective fields.

Conclusion

Tien-Chun Wei's contributions to the field of fault detection and testing are noteworthy. His innovative patent and work at Synopsys, Inc. reflect his commitment to advancing technology. As an inventor, he continues to influence the industry with his groundbreaking ideas and methodologies.