Tianyi Wang

Title: Innovations of Tianyi Wang in Collimated Phase Measuring Deflectometry

Introduction

Tianyi Wang is an accomplished inventor based in Ridge, NY (US). He has made significant contributions to the field of optical measurement technology. His innovative work focuses on collimated phase measuring deflectometry, which has applications in various scientific and industrial settings.

Latest Patents

Tianyi Wang holds a patent for a system and method related to collimated phase measuring deflectometry. This patent describes a collimated phase measuring deflectometer system that includes a screen emitting a structured light pattern. The system features a collimation optical system with a Fourier lens, a beam splitter to redirect the structured light pattern, and a camera with a telecentric lens to capture the deflected pattern produced by illuminating a surface of a specimen under test (SUT). Notably, the deflection pattern remains insensitive to the distance from the deflectometer to the SUT surface. The method also includes steps for emitting, collimating, and reflecting light to acquire an image of the deflected pattern.

Career Highlights

Tianyi Wang is currently employed at Brookhaven Science Associates, LLC, where he continues to advance his research and development efforts. His work has garnered attention for its innovative approach to optical measurement, contributing to the advancement of technology in this field.

Collaborations

Tianyi has collaborated with notable colleagues, including Lei Huang and Mourad Idir, who share his passion for innovation and research in optical technologies.

Conclusion

Tianyi Wang's contributions to collimated phase measuring deflectometry exemplify the spirit of innovation in optical measurement technology. His patent and ongoing work at Brookhaven Science Associates, LLC, highlight his commitment to advancing this important field.