The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Jun. 24, 2024
Brookhaven Science Associates, Llc, Upton, NY (US);
Brookhaven Science Associates, LLC, Upton, NY (US);
Abstract
Various examples relate to collimated phase measuring deflectometry. In one example, is a collimated phase measuring deflectometer system with a screen that emits a structured light pattern; a collimation optical system comprising a Fourier lens positioned such that the structured light pattern passes through the collimation optical system; a beam splitter positioned such that the structured light pattern is redirected to illuminate a surface of a specimen under test (SUT); and a camera having a telecentric lens positioned such that a deflected pattern produced by illuminating the surface of the SUT is captured by the camera. The deflection pattern is insensitive to the distance from the collimated phase measuring deflectometer to the SUT surface. In another example, a method includes emitting a structured light pattern; collimating the emitted light pattern; reflecting collimated light to illuminate a SUT surface; and acquiring an image of a deflected pattern produced by the illumination.