Mourad Idir

Title: Mourad Idir: Innovator in Collimated Phase Measuring Deflectometry

Introduction

Mourad Idir is a notable inventor based in South Setauket, NY (US). He has made significant contributions to the field of optical measurement through his innovative patent in collimated phase measuring deflectometry. His work has implications for various applications in optical testing and measurement.

Latest Patents

Mourad Idir holds a patent for a system and method related to collimated phase measuring deflectometry. This patent describes a collimated phase measuring deflectometer system that includes a screen emitting a structured light pattern. The system features a collimation optical system with a Fourier lens, a beam splitter to redirect the structured light pattern, and a camera with a telecentric lens to capture the deflected pattern produced by illuminating a surface of a specimen under test (SUT). The deflection pattern is designed to be insensitive to the distance from the deflectometer to the SUT surface. Additionally, the method involves emitting a structured light pattern, collimating it, reflecting the collimated light to illuminate the SUT surface, and acquiring an image of the resulting deflected pattern.

Career Highlights

Mourad Idir is currently associated with Brookhaven Science Associates, LLC, where he continues to advance his research and development in optical measurement technologies. His work is characterized by a commitment to innovation and precision in the field.

Collaborations

Mourad collaborates with talented colleagues, including Tianyi Wang and Lei Huang, who contribute to the research and development efforts at Brookhaven Science Associates, LLC.

Conclusion

Mourad Idir's contributions to collimated phase measuring deflectometry exemplify the impact of innovative thinking in optical measurement technologies. His patent and ongoing work continue to influence the field positively.