Tiancong Wang

Title: Innovations of Tiancong Wang in Micro-nano Automation

Introduction

Tiancong Wang is a notable inventor based in Suzhou, China. He has made significant contributions to the field of micro-nano automation through his innovative methods and technologies. His work focuses on enhancing the efficiency and effectiveness of atomic force microscopy (AFM) by integrating it with scanning electron microscopy (SEM).

Latest Patents

Tiancong Wang holds a patent for a method titled "Method for SEM-guided AFM scan with dynamically varied scan speed." This innovative method discloses how to extract topography information from SEM images to determine the AFM image scanning speed at each sampling point or region on a sample. The process involves three key steps: first, processing SEM images to extract possible topography features and create a feature metric map; second, converting the feature metric map into an AFM scan speed map; and third, performing the AFM scan according to the scan speed map. This method allows for higher scan speeds in areas with fewer topography features and lower speeds in regions rich in topography features.

Career Highlights

Tiancong Wang is associated with the Jiangsu Jitri Micro-nano Automation Institute Co., Ltd., where he applies his expertise in micro-nano automation. His work has been instrumental in advancing the capabilities of AFM technology, making it more adaptable to varying sample topographies.

Collaborations

Tiancong Wang collaborates with talented individuals such as Yu Sun and Jun Chen, who contribute to the innovative projects at the institute. Their teamwork fosters a creative environment that enhances research and development in micro-nano automation.

Conclusion

Tiancong Wang's contributions to the field of micro-nano automation, particularly through his patented method for SEM-guided AFM scanning, demonstrate his commitment to innovation. His work not only advances technology but also sets a foundation for future developments in the field.