Aalen-Dewangen, Germany

Thomas Rettenmaier

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Smt Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Rettenmaier. Retrieved from https://idiyas.com/inventor/thomas-rettenmaier-olx3li0r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Thomas Rettenmaier and His Patent in Lithography Temperature Measurement.

Introduction

Thomas Rettenmaier is an inventor associated with Aalen-Dewangen, Germany. His listed patent work concerns temperature measurement in optical systems used in lithography apparatus. He is associated with Carl Zeiss SMT GmbH.

Latest Patents

Rettenmaier is credited with 1 patent: “Temperature Measuring Device, Lithography Apparatus and Method for Measuring a Temperature.” The invention describes a device for measuring temperature at or within an optical system of a lithography apparatus. It uses an activation source to generate a measurement current or voltage, temperature resistors, and switching and voltage-detection components. A temperature-determination unit uses the measurements to establish the temperature.

Career Highlights

The patent reflects work on temperature sensing for lithography equipment, where monitoring an optical system’s temperature can support precise operation. Rettenmaier’s listed company affiliation is Carl Zeiss SMT GmbH.

Collaborations

Lars Berger is identified as Rettenmaier’s coworker. The available information does not specify their particular collaboration or respective contributions to the patent.

Conclusion

Thomas Rettenmaier’s recorded patent focuses on measuring temperature in lithography apparatus, connecting his inventive work with optical-system monitoring at Carl Zeiss SMT GmbH.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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