Thomas M Storey

Title: Thomas M Storey: Innovator in Integrated Circuit Testing

Introduction

Thomas M Storey is a notable inventor based in Manassas, VA (US), recognized for his contributions to the field of integrated circuit testing. With a total of 4 patents to his name, Storey has developed innovative methods that enhance the reliability and efficiency of electronic components.

Latest Patents

One of Storey's latest patents is titled "System and method for temporally isolating environmentally sensitive integrated circuit faults." This invention outlines a procedure for identifying and isolating faults in integrated circuits that are affected by environmental conditions. The method involves determining marginally failing and minimally passing environmental conditions, identifying the clock cycle at which a fault was first detected, and applying test patterns iteratively to pinpoint the exact clock cycle of the fault occurrence. This technique utilizes a binary search method to optimize the fault detection process.

Another significant patent is the "Method for testing of known good die." This patent describes a multi-pattern data retention testing approach for producing Known Good Dies. The process includes writing and reading data in memory devices, such as SRAM, and comparing patterns to ensure data accuracy. Additionally, it incorporates iterative testing to monitor changes in chip operating parameters, enhancing the reliability of semiconductor devices.

Career Highlights

Throughout his career, Thomas M Storey has worked with prominent companies, including IBM and BAE Systems Information and Electronic Systems Integration Inc. His experience in these organizations has contributed to his expertise in integrated circuit technology and testing methodologies.

Collaborations

Storey has collaborated with notable professionals in the field, including Edward J Spall and Henry C Baron. These partnerships have likely fostered innovation and advancements in integrated circuit testing.

Conclusion

Thomas M Storey is a distinguished inventor whose work in integrated circuit testing has led to significant advancements in the field. His innovative patents and collaborations reflect his commitment to enhancing electronic reliability and performance.