Aarau, Switzerland

Thomas Lüthi

This inventor holds 17 USPTO granted patents and 6 published patent applications and 15 EPO patents, primarily in Laser Measurement Technology. Top assignee: Leica Geosystems Ag. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Lüthi. Retrieved from https://idiyas.com/inventor/thomas-luthi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 17 

% Patents Active = 88.2

 

Average Co-Inventor Count = 2.3

ph-index = 3

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 2016-2026

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Areas of Expertise:
Metrology System
Coordinate Measuring Device
Laser Tracker
Interferometer
Dynamic Targets
Electro-Optic Modulator
Distance Measurement
Calibration Unit
Automatic Target Recognition
Absorption Medium
Measurement Beam
TEC Module
17 patents (USPTO):Explore Patents

Title: Thomas Lüthi - Innovative Inventor from Aarau, CH

Introduction: Thomas Lüthi is a renowned inventor hailing from Aarau, Switzerland, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Thomas Lüthi holds several patents in the areas of renewable energy, sustainable transportation, and advanced materials, showcasing his commitment to creating a more sustainable future.

Career Highlights: With over two decades of experience in the industry, Thomas Lüthi has worked with leading research institutions and companies to develop cutting-edge technologies that have revolutionized various sectors.

Collaborations: Throughout his career, Thomas Lüthi has collaborated with top engineers, scientists, and inventors from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Thomas Lüthi's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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