The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Oct. 11, 2019
Applicant:
Leica Geosystems Ag, Heerbrugg, CH;
Inventors:
Duncan Redgewell, Nieder Erlinsbach, CH;
Markus Steiner, Gränichen, CH;
Thomas Lüthi, Aarau, CH;
Veroljub Maksimovic, Biberist, CH;
Raimund Loser, Bad Säckingen, DE;
Assignee:
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 5/008 (2006.01); G01C 11/00 (2006.01); G01S 7/00 (2006.01); G01S 7/48 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 5/008 (2013.01); G01C 11/00 (2013.01); G01S 7/003 (2013.01); G01S 7/4808 (2013.01); G01S 7/497 (2013.01);
Abstract
The invention relates generally to a metrology system and coordinate measuring devices to be used within the framework of a smart factory environment, which has a defined arrangement of different metrology devices, configured such that coordinate measuring data generated by different metrology devices are referencable to a common coordinate system.