Meppen, Germany

Thomas Kernen

This inventor holds 1 USPTO granted patent. Top assignee: Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Kernen. Retrieved from https://idiyas.com/inventor/thomas-kernen-jgmvm14f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Thomas Kernen

Introduction

Thomas Kernen is a notable inventor based in Meppen, Germany. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent related to aberration correction.

Latest Patents

Kernen holds a patent for an "Aberration Corrector and Method of Aligning Aberration Corrector." This invention features a complex design that includes a plurality of magnetic poles, a ring for magnetic connection, and magnetic field modulators. The patent addresses the alignment of the aberration corrector, ensuring precise functionality in various applications.

Career Highlights

Thomas Kernen is associated with Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh, where he applies his expertise in semiconductor testing and technology. His work has been instrumental in advancing the capabilities of integrated circuits.

Collaborations

Kernen collaborates with talented individuals such as Matthias Firnkes and Florian Lampersberger, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Thomas Kernen's contributions to the field of semiconductor technology through his patent and collaborative efforts highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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