Delmar, NY, United States of America

Thomas J Bievenue

This inventor holds 7 USPTO granted patents and 2 EPO patents. Top assignee: X-Ray Optical Systems Incorporated. Active years: 2004-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas J Bievenue. Retrieved from https://idiyas.com/inventor/thomas-j-bievenue

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 85.7

 

Average Co-Inventor Count = 4.0

ph-index = 5

Forward Citations = 96(Granted Patents)


Company Filing History:


Years Active: 2004-2009

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7 patents (USPTO):Explore Patents

Title: The Innovative Journey of Thomas J. Bievenue

Introduction: Thomas J. Bievenue, a talented inventor hailing from Delmar, NY, has made significant contributions to the field of innovations with his creative mindset and dedication.

Latest Patents: Thomas J. Bievenue holds several patents in various industries, showcasing his versatility and ingenuity in inventing new solutions to existing problems.

Career Highlights: Throughout his career, Thomas J. Bievenue has been recognized for his groundbreaking inventions that have had a positive impact on society. His commitment to pushing the boundaries of what is possible has led to numerous successful ventures.

Collaborations: Thomas J. Bievenue has collaborated with leading research institutions, universities, and companies to bring his inventions to life. These partnerships have been instrumental in the development and commercialization of his innovative ideas.

Conclusion: In conclusion, Thomas J. Bievenue stands as a beacon of innovation, inspiring others to think outside the box and pursue their creative ideas. His contributions to the world of inventions have left a lasting legacy that will continue to shape the future of technology and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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