The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Jan. 23, 2004
Thomas J. Bievenue, Delmar, NY (US);
John H. Burdett, Jr., Charlton, NY (US);
Thomas J. Bievenue, Delmar, NY (US);
John H. Burdett, Jr., Charlton, NY (US);
X-Ray Optical Systems Incorporated, Albany, NY (US);
Abstract
Methods and devices for aligning an x-ray optic with a source of x-rays and methods and devices for determining a focusing characteristic of an x-ray optic are provided. The methods and devices simplify the process of aligning an x-ray optic device (for example, a polycapillary x-ray optic) to an x-ray source or for measuring a focusing characteristic, for example, the focal length or beam shape, of an x-ray optic. In one aspect, the device includes a housing having a first aperture adapted for receiving an x-ray optic and a surface having an x-ray flourescent material from which visual fluorescence occurs when impinged by x-rays. The size and shape of fluorescence from the surface may be varied by moving the surface to determine, for example, the focal length of the x-ray optic.