München, Germany

Thomas Huelsmann


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Thomas Huelsmann: Innovator in Semiconductor Testing Technology

Introduction

Thomas Huelsmann is a notable inventor based in München, Germany. He has made significant contributions to the field of semiconductor technology, particularly in the testing of semiconductor structures. His innovative approach aims to enhance the reliability and efficiency of semiconductor testing processes.

Latest Patents

Huelsmann holds a patent for an "Arrangement for the testing of semiconductor structures." This invention provides an apparatus designed for testing semiconductor structures effectively. The apparatus includes a chuck for holding a semiconductor wafer and needle holders for contact needles. The chuck is equipped with a fastening device for the semiconductor wafer and is movable for precise positioning in relation to the contact needles. The primary objective of this invention is to detect faults in non-serviceable or partially serviceable chips before separation, thereby preventing unnecessary work in separating and assembling defective chips. The design features a receiving area that exposes the lower surface of the semiconductor wafer, with contact needles positioned to make contact with the semiconductor chips.

Career Highlights

Huelsmann is associated with Karl Suss Dresden GmbH, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing testing methodologies that ensure the quality and reliability of semiconductor products.

Collaborations

Some of his notable coworkers include Reinhard Welsch and Claus Dietrich, who have collaborated with him on various projects within the semiconductor industry.

Conclusion

Thomas Huelsmann's contributions to semiconductor testing technology reflect his commitment to innovation and quality. His patent serves as a testament to his expertise and the importance of reliable testing in the semiconductor field.

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