Horn, Austria

Thomas Fälbl

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Riegl Laser Measurement Systems Gmbh. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Fälbl. Retrieved from https://idiyas.com/inventor/thomas-fälbl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Thomas Fälbl: Innovator in Laser Scanning Technology

Introduction

Thomas Fälbl is a notable inventor based in Horn, Austria. He has made significant contributions to the field of laser scanning technology, particularly with his innovative designs that enhance vehicle capabilities.

Latest Patents

Fälbl holds a patent for a laser scanning device designed for mounting on the roof rack of a vehicle. This invention features a base support configured in an 'X' shape, which can be securely mounted on a roof rack. The design allows for a laser scanning module to be fixed at the fork of the 'X', enabling efficient scanning capabilities.

Career Highlights

Fälbl is associated with Riegl Laser Measurement Systems GmbH, a company renowned for its advancements in laser measurement technology. His work at Riegl has positioned him as a key player in the development of innovative laser scanning solutions.

Collaborations

Throughout his career, Fälbl has collaborated with esteemed colleagues such as Rainer Reichert and Johannes Riegl. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Thomas Fälbl's contributions to laser scanning technology exemplify his innovative spirit and dedication to advancing vehicle capabilities. His work continues to influence the industry and inspire future developments in laser measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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