Horn, Austria

Riegl Laser Measurement Systems Gmbh

USPTO Granted Patents = 25



Trademarks = 15

Forward Citations = 241

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12 inventors (with patents filed for the assignee):

goldMedal Johannes Riegl (16 out of 19 patents)

silverMedal Andreas Ullrich (11 out of 14 patents)

bronzeMedal Rainer Reichert (5 out of 9 patents)

4.  Martin Pfennigbauer (5 out of 6 patents)

5.  Peter Rieger (4 out of 4 patents)

6.  Nikolaus Studnicka (3 out of 3 patents)

7.  Andreas Hofbauer (2 out of 3 patents)

8.  Wolfgang Zierlinger (2 out of 2 patents)

9.  Gerald Zach (1 out of 3 patents)

10.  Thomas Fälbl (1 out of 1 patent)

11.  Walter Schubert (1 out of 1 patent)

12.  Gerhard Ederer (1 out of 1 patent)

13.  Ursula Riegl (1 patent)

14.  Rolf Lamm (4 patents)

15.  Andreas Stoeger (1 patent)


Core Competencies:
Laser Scanner
Optical Device
Range Finding
Distance Measurement
Laser Hydrography
Pod Mountable
Scanning Apparatus
Orthogonal View
Object Space
Reception Time
Monitoring Objects
Measurement Method

25 patents:

Company Overview
Riegl Laser Measurement Systems GmbH, based in Horn, Austria, specializes in advanced laser scanning technology. The company develops high-precision 3D laser scanners and measurement systems that cater to various industries, including surveying, civil engineering, and environmental monitoring. Riegl is recognized for its innovative solutions in airborne, terrestrial, and mobile laser scanning, enabling accurate data acquisition and analysis for complex projects. Their commitment to research and development positions them as a leader in the field of laser measurement technology.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

25 Patents

#1 in Horn

#143 in Austria

#25,730 in the World

Horn, AT
Horn, Austria
Forward Citations = 241

12 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Riegl Laser Measurement Systems Gmbh. Retrieved from https://idiyas.com/company/riegl-laser-measurement-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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