This inventor holds 1 USPTO granted patent. Top assignee: Carnegie Mellon University. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: Thomas E Marchok: Innovator in Electronic Circuit Testing
Introduction
Thomas E Marchok is a notable inventor based in Latrobe, PA (US). He has made significant contributions to the field of electronic circuit testing, particularly in the area of test pattern generation. His innovative approach enhances both the efficiency and quality of test patterns for sequential logic circuits.
Latest Patents
Thomas E Marchok holds 1 patent for his invention titled "Test pattern generation for an electronic circuit using a transformed test pattern generation for a sequential logic circuit having combinational logic elements and sequential elements (D flip-flops)." This patent focuses on improving the generation time and quality of test patterns by transforming the circuit to simplify the process. The method involves using retiming transformations, which allow sequential elements to be moved across combinational logic elements. This increases the ratio of traversable states, thereby simplifying the circuit for test pattern generation. The test set produced is applicable to both the transformed test circuit and the manufactured circuit.
Career Highlights
Thomas E Marchok is affiliated with Carnegie Mellon University, where he continues to contribute to advancements in electronic engineering and circuit design. His work has been instrumental in enhancing the reliability and efficiency of electronic systems.
Collaborations
Some of his notable coworkers include Aiman H El-Maleh and Wojciech P Maly, who have collaborated with him on various projects related to electronic circuit testing and design.
Conclusion
Thomas E Marchok's innovative work in test pattern generation has made a significant impact on the field of electronic circuits. His contributions continue to influence the development of more efficient testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
