Middlesex, United Kingdom

Thomas Chaton

This inventor holds 1 USPTO granted patent and 3 EPO patents. Top assignee: Fujitsu Liimited. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Chaton. Retrieved from https://idiyas.com/inventor/thomas-chaton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Thomas Chaton: Innovator in Surface Defect Identification

Introduction

Thomas Chaton is a notable inventor based in Middlesex, GB. He has made significant contributions to the field of material surface analysis through his innovative patent. His work focuses on enhancing the identification of surface defects, which is crucial for various industries.

Latest Patents

Thomas Chaton holds a patent for a "Surface defect identification method and apparatus." This invention involves a computer-implemented method for processing images of material surfaces to identify defects. The method includes training a neural network to generate reduced-defect versions of training images of material surfaces. It also involves acquiring an image of a subject material surface, inputting this image into the neural network, and comparing the generated reduced-defect version with the acquired image to identify differences. Defects on the subject material surface can be identified at the locations of these differences.

Career Highlights

Throughout his career, Thomas has worked with Fujitsu Limited, where he has applied his expertise in image processing and neural networks. His innovative approach has contributed to advancements in quality control and defect detection in manufacturing processes.

Collaborations

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Conclusion

Thomas Chaton is a pioneering inventor whose work in surface defect identification has the potential to revolutionize quality assurance in various industries. His contributions reflect the importance of innovation in enhancing manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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