The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Mar. 31, 2020
Applicant:
Fujitsu Limited, Kawasaki, JP;
Inventor:
Thomas Chaton, Middlesex, GB;
Assignee:
FUJITSU LIIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/70 (2017.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 7/70 (2017.01); G06T 2200/24 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract
Embodiments include a computer implemented method of processing images of material surfaces to identify defects on the imaged material surface, the method including training a neural network to generate reduced-defect versions of training images of material surfaces; acquiring an image of a subject material surface; inputting the acquired image to the neural network to generate a reduced-defect version of the acquired image; and comparing the reduced-defect version of the acquired image with the acquired image to identify differences. Defects on the subject material surface at locations of the identified differences are identifiable.