Company Filing History:
Years Active: 1997-2000
Title: Innovations by Thomas A. Rampone
Introduction
Thomas A. Rampone is a notable inventor based in Hillsboro, Oregon. He has made significant contributions to the field of circuit board technology, holding a total of five patents. His work primarily focuses on methods and apparatuses that enhance the testing and reliability of electronic components.
Latest Patents
One of his latest patents is titled "Method and apparatus for stress testing of a circuit board assembly." This invention discloses a method and apparatus for testing a circuit board by providing a clock signal at a dynamically selected frequency. The apparatus includes a clock source, a storage medium for programming instructions, and an execution unit. This innovative approach allows for parametric testing of the circuit board while exceeding its specified operating frequency, thereby stressing the circuit board to ensure its reliability.
Another significant patent by Rampone is "Method and apparatus for facilitating detection of solder opens of SMT." This invention features a split-pad land pattern designed to facilitate electrical testing of interconnections between surface mount technology components and printed circuit boards. The design includes split mounting pads coupled to access pads, enabling effective electrical testing of the components.
Career Highlights
Thomas A. Rampone is currently employed at Intel Corporation, where he continues to innovate in the field of electronics. His work at Intel has allowed him to collaborate with other talented engineers and inventors, contributing to advancements in technology.
Collaborations
Some of his notable coworkers include Jerald N. Hall and Kirk Tyler Byers. Their collaborative efforts have further enhanced the development of innovative solutions in the electronics industry.
Conclusion
Thomas A. Rampone's contributions to circuit board technology through his patents demonstrate his commitment to innovation and excellence in the field. His work continues to impact the reliability and performance of electronic components.