The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Jan. 02, 1997
Thomas A Rampone, Hillsboro, OR (US);
Jerald N Hall, Scappoose, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A method and apparatus for testing a circuit board is disclosed. An apparatus having at least one clock source for providing a circuit board with a clock signal at a dynamically selected frequency, a storage medium storing programming instructions to control the clock source(s) to provide the clock signal at the dynamically selected frequency including a frequency that exceeds the specified operating range of frequencies for the circuit board, and for implementing parametric testing of the circuit board, and an execution unit coupled to the clock source and to the storage medium for executing the programming instructions. The programming instructions for implementing the parametric testing of the circuit board include instructions for testing the circuit board while the circuit board is supplied with the clock signal at the frequency that exceeds the operating frequency of the circuit board, thereby stressing the circuit board. The programming instructions cause the one or more clock sources to gradually increase the dynamically selected clock signal frequency to the frequency that exceeds the operating frequency of the circuit board.