Tainan, Taiwan

Thi-Thu-Hien Pham

This inventor holds 1 USPTO granted patent. Top assignee: National Cheng-Kung University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thi-Thu-Hien Pham. Retrieved from https://idiyas.com/inventor/thi-thu-hien-pham

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations of Thi-Thu-Hien Pham in Optical Parameter Measurement

Introduction: Thi-Thu-Hien Pham is an accomplished inventor based in Tainan, Taiwan. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on developing advanced apparatuses for measuring optical parameters.

Latest Patents: Thi-Thu-Hien Pham holds a patent for an "Optical parameter measuring apparatus and optical parameter measuring method." This invention includes a light source, a polarizing module, a Stokes polarimeter, and a calculating module. The apparatus is designed to measure various optical parameters of an object by utilizing polarized light and advanced calculations based on the Mueller matrixes.

Career Highlights: Thi-Thu-Hien Pham is affiliated with National Cheng-kung University, where he contributes to research and development in optical technologies. His work has garnered attention for its practical applications in various scientific fields.

Collaborations: Thi-Thu-Hien Pham collaborates with Yu-Lung Lo, who is also involved in research related to optical measurements. Their partnership enhances the scope and impact of their work in the field.

Conclusion: Thi-Thu-Hien Pham's innovative contributions to optical parameter measurement demonstrate his expertise and commitment to advancing technology in this area. His patent reflects a significant step forward in the ability to analyze optical properties effectively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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