The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Dec. 28, 2011
Applicants:

Yu-lung Lo, Tainan, TW;

Thi-thu-hien Pham, Tainan, TW;

Inventors:

Yu-Lung Lo, Tainan, TW;

Thi-Thu-Hien Pham, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01J 4/04 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01);
Abstract

An optical parameter measuring apparatus for measuring optical parameters of an object includes a light source, a polarizing module, a Stokes polarimeter and a calculating module. The light source emits a light which is polarized by the polarizing module and received by the Stokes polarimeter. According to the light information generated by the Stokes polarimeter, Mueller matrixes of linear birefringence, circular birefringence, linear dichroism, circular dichroism and linear/circular depolarization of the object, and Stokes vector established according to the Mueller matrixes, the calculating module calculates the optical parameters.


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